Scanning Electron Microscope (SEM)

The SEM Consists of:

  • EVO-40 manufactured by ZEISS (Germany)
  • JCM-5700 manufactured by JEOL (Japan) with EDS
Scanning Electron Microscope | Biomedical Engineering | Joint Graduate Program     Scanning Electron Microscope | Biomedical Engineering | Joint Graduate Program

With these SEMs, the core has attachments for different analyses, such as the nano manipulator for evaluating nanomaterials and EDS for measuring elemental composition. Analysis of dimensions or size of area of interest can also be measured using the SEM software. Other SEM capabilities include the evaluation of 3-D samples. For information on the use of the SEM core facility or user price, please contact Dr. Jing Yong Ye at 210-458-7084 | e-mail: jingyong.ye@utsa.edu.

Scanning Electron Microscope | Biomedical Engineering | Joint Graduate Program     Scanning Electron Microscope | Biomedical Engineering | Joint Graduate Program